Dayton Chapter Joint Meeting with Cincinnati ASM and Dayton AWS
3D Characterization of the Structure and Crystallography of Aerospace
Materials using a Dual Beam FIB-SEM
Dr. Michael D. Uchic
Air Force Research Laboratory
Location:
5:30
p.m. Social
Chantrells Restaurant
6:30
p.m. Dinner ($20.00, Students: FREE) 20
Commercial Way
7:30
p.m. Program
Springboro, Ohio
937-743-6073
For Reservations: Menu:
Call Chuck Woods 937-236-8315 salmon, onion rib eye
E-mail: cwoods@globalms.com Sautee Zucchini, Squash
On-line: http://www.asm-dayton.org Wild Rice Pilaf
By 3:00 p.m. Wednesday, January 10, 2007 7-layer salad, Appetizer
Rolls, Seasonal pies and Cakes,
Beverage
ABSTRACT
The Dual Beam Focused Ion Beam (FIB)-Scanning Electron Microscope (SEM)
has proved to be a powerful instrument for characterizing the
microstructure and crystallography of aerospace materials in 3D. The DB
FIB-SEM is capable of in-situ, high fidelity serial sectioning, where
the serial sectioning slice thickness can be ~25 nanometers, and the
interrogated volume can be as large as 50 x 50 x 50 micrometers in
dimension. Custom scripting routines have been developed at AFRL to
automate the serial sectioning experiments. Notably, the scripting
program is designed to control the acquisition of a variety of
characterization data from each sectioned surface. This data includes
electron images, ion images, crystallographic orientation maps (EBSD),
and chemistry maps (EDS). This talk will focus on the application of
the Dual Beam microscope to characterize Ni base superalloys in 3D, but
examples from other alloy systems will also be shown.
SPEAKER BIO
Michael D. Uchic, Air Force Research Laboratory
Michael D. Uchic is a materials research engineer in the Metals Development Group of the Air Force Research Laboratory, Materials & Manufacturing Directorate. He received his Ph.D. from Stanford University, and for his thesis topic he characterized the low-temperature mechanical properties of the intermetallic alloy Ni3Al.